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2 article(s) from Syty, Paweł

Evolution of Ag nanostructures created from thin films: UV–vis absorption and its theoretical predictions

Robert Kozioł,
Marcin Łapiński,
Paweł Syty,
Damian Koszelow,
Wojciech Sadowski,
Józef E. Sienkiewicz and
Barbara Kościelska

Beilstein J. Nanotechnol. 2020, 11, 494–507, doi:10.3762/bjnano.11.40

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Figure 1: Side view of a part of the simulation setup, illustrating the shape of the Ag nanoparticles, modell...

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Figure 2: Top view of the simulation setup.

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Figure 3: SEM images of the films after annealing at 250 °C for 15 min. Initial film thickness was: (a) 1 nm,...

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Figure 4: SEM images of the films after annealing at 550 °C for 15 min. Initial film thickness was: (a) 1 nm,...

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Figure 5: The dependence of the island diameter on the thickness of the initial film, calculated for Ag films...

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Figure 6: SEM images of a 2.8 nm thick film, annealed at a constant temperature of 550 °C for different perio...

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Figure 7: SEM images of a 2.8 nm thick film, annealed for a constant time 15 min at different temperatures: (...

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Figure 8: (a) HRTEM image of a cross section of a nanoisland formed from a 3 nm thick film, annealed at 550 °...

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Figure 9: Absorbance of nanostructures formed from thin films with different thickness, annealed at (a) 250 °...

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Figure 10: Calculated scattering efficiencies (absorption, scattering and extinction) in air obtained from Mie...

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Figure 11: Absorbance of nanostructures formed from 2.8 nm thick films (a) annealed at 100, 200, 300, 400, 500...

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Figure 12: (a) Ag 3d and (b) Ag 4d XPS spectra of bulk Ag and Ag nanostructures grown after annealing of 2 nm ...

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Figure 13: a) Calculated intensity distribution of the electromagnetic field integrated on the plane where nan...

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Figure 14: Calculated amplitudes of the components of the electromagnetic field in the plane where the nanopar...

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Figure 15: Calculated amplitudes of the components of the electromagnetic field as a function of the time, at ...

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Figure 16: Calculated absorbance log(Φ_i/Φ_t), where Φ_i and Φ_t are incident and transmitted flux, respectively, ...

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Figure 17: Positions of a) the first and b) the second absorbance maxima (corresponding to the quadrupole and ...

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Full Research Paper

Published 25 Mar 2020

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Au–Si plasmonic platforms: synthesis, structure and FDTD simulations

Anna Gapska,
Marcin Łapiński,
Paweł Syty,
Wojciech Sadowski,
Józef E. Sienkiewicz and
Barbara Kościelska

Beilstein J. Nanotechnol. 2018, 9, 2599–2608, doi:10.3762/bjnano.9.241

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Figure 1: Scheme of the formation of the gold nanoislands.

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Figure 2: SEM images of 2.8 nm Au films on a Si(111) substrate: a) as prepared, annealed at b) 150 °C, c) 200...

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Figure 3: SEM images of 2.8 nm Au films on a Si(111) substrate annealed at a) 450 °C, b) 550 °C, c) 600 °C fo...

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Figure 4: SEM images of Au films of different thicknesses on a Si(111) substrate annealed at 550 °C for 15 mi...

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Figure 5: a) Number of nanoparticles and b) average diameter of nanoparticles as function of the Au film thic...

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Figure 6: Left: AFM image of a 2.8 nm Au film on a Si(111) substrate annealed at 550 °C for 15 min; right: cr...

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Figure 7: XRD result of a 2.8 nm Au film annealed at 550 °C for 15 min and an as-prepared 2.8 nm Au film on S...

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Figure 8: XPS (Au region) results for the 2.8 nm Au thin film on a Si(111) substrate annealed at 550 °C for 1...

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Figure 9: XPS result (Si region) for the 2.8 nm Au film on a Si(111) substrate annealed at 550 °C for 15 min.

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Figure 10: Absorbance spectra recorded for a 2.8 nm Au film on a Si(111) substrate annealed at 550 °C for 15 m...

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Figure 11: SEM image of the gold nanoislands on the silicon substrate (sample 2.8 nm Au film on Si(111) substr...

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Figure 12: Setup for the FDTD and FDTD/DFT simulations. Left: view from the bottom, zx-plane; yellow rectangle...

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Figure 13: Calculated intensity distribution of the electromagnetic field with unpolarized incident light of a...

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Figure 14: Calculated amplitudes of the components of the electromagnetic field with unpolarized incident ligh...

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Figure 15: Calculated absorbance (as log(I_o/I_r), where I_o is an incident flux, and I_r – reflected flux), as th...

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Full Research Paper

Published 28 Sep 2018

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